Description
Uses a physical probe to scan a surface, measuring topographical and mechanical forces (stiffness, adhesion) at sub-nanometric resolution.
How this lab uses this technology
Possibility of High Speed/Fast AFM
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Atomic Force Microscopy (AFM) at Basque Resource for Advanced Light Microscopy
Atomic Force Microscopy (AFM)
Basque Resource for Advanced Light Microscopy
Bilbao
1
Equipment
0
Technical Resources