Description
Contrast-enhancing technique that uses oblique illumination to block the central beam, detecting only light scattered by the sample.
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Darkfield Microscopy (DFM) at Servei Microscòpia i Imatges CRAG
Darkfield Microscopy (DFM)
Servei Microscòpia i Imatges CRAG
Cerdanyola del Vallès, Barcelona
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Equipment
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Technical Resources